Sample preparation laboratory is equipped with following device for active TEM foils preparation:

1. Glove box for mechanical preparation of thin slices

2. MiniMet 1000 system for grinding (metal samples)

3. Ion polishing system for irradiated TEM foils preparation by (Ar+) ions which are hitting the specimen at a low angle. System allows the quality specimen preparation for advanced TEM methods. Ion polishing system is equipped with protective elements which ensure the specimen transport to the system chamber and safety operation during active specimen preparation. System ensure the polishing of the specimen - disc from both sides or only one side polishing. Foil thickness after specimen preparation can reach 10-30 mm to be transparent for TEM. Method allows the preparation from heterogenous as well as non-conductive materials. During specimen preparation, the process is allowed to be controled by optical microscope with digital camera. Equipments for mechanical sample preparation for thinning of TEM discs is the part of the preparation system, it ensures the process time reduction and optimize the surface for quality TEM foil.

PIPS II Ion Polisher: Polishing of thin samples for TEM - argon ion beam (Argon 4.8, Nitrogen)

The device under high vacuum connected to the supply of argon and nitrogen.

RKB : Mechanical sample pre-preparation (Ethanol circuit, Water circuit)

MiniMet 1000: grinding active metal samples

Accesssories:

Tweezers

Peans

SiC foils 

Ethanol

Acetone

Gloves