High-Resolution Transmission Electron Microscope (HR-STEM) used mainly for radiation-induced damage analyses after neutron exposition. TEM enables microstructural studies, chemical analyses and crystallographic analyses at subnanometric level. Electron source FEG (Field Emission Gun) enables high resolution higher than 0.2 nm, maximum accelerating voltage is 200 kV. Detectors for STEM are HAADF, ADF and BF. Diffraction modes are CBED, NBED, SAED. Chemical analyses are performed with EDS, EELS, EFTEM.

• Electron Source: Field Emission Gun (FEG)
• Accelerating Voltage: 200 kV
• Resolution: higher than 0.2 nm (up to 0.07 nm)
• HAADF STEM detector for Z-contrast
• EDX a EELS detectors for chemical analysis
• EF-TEM for high resolution, contrast and chemical analysis
• SAED, CBED, NBED modes