Sample preparation for TEM, SEM and SIMS analysis. Work with non-active

and active samples. Ion polishing system for TEM and SEM. C and Au sputtering coater.

Au Sputtering coater Q150T S:

• High resolution sputtering coater suitable for oxidizing and non-oxidizing metals
• Cr target is available (SEM, TEM, SIMS)

C sputtering coater Q150T E: 

• High resolution sputtering coater for SEM and TEM applications
• Equipped with inlay for carbon stick

Ion polishing system Ilion +II: 

• Bulk sample polishing with Ar ion beam (SEM)

Ion polishing system PIPS II: 

• Thin foil polishing with Ar ion beam (TEM)

Dimple grinder: 

• Mechanical grinding system for ultrathin (< 20 µm) sample preparation (TEM)