Scanning probe microscope model Dimension Edge Bruker company.

The instrument is designed to determine the surface structure with nanometer lateral resolution and subnanometric resolution in a direction perpendicular to the surface. In addition to surface topography, local physicochemical properties of the surface can be measured using this device and performing nanolithographic operations and manipulations.

The instrument is designed to characterize materials at the atomic level.

Measuring modes

• contact, tapping and non-contact AFM
• phase contrast mode
• power spectroscopy
• ScanAsyst, PeakForce Tapping
• tunneling AFM, STM
• lithography

Movable scanning head

• movement in X, Y and Z axes
• maximum movement in X and Y axes 90 μm, Z 10 μm

Motorized table

• movement in X, Y axes
• maximum movement 150 x 150 mm
• the possibility of inserting a sample with up to 150 mm in diameter and up to 40 mm high

Vibration isolation table

• pneumatic
• weight 295 kg
• dimensions: 611 mm x 611 mm x 787 mm

Dimension Edge Control System

• based on the Dimension Edge NanoDrive Controller
• control of air and vacuum for a motorized table

Air Vacuum Module Kit

• delivers compressed air or a vacuum for a motorized table

Tunnel / Conductivity AFM Module (TUNA / CAFM)

• allows the measurement of low and ultra low currents during scanning
• the optional filter allows to achieve low noise
• a current amplifier with a resolution of approximately 50 fA in two ranges; 10 pA in the entire range and 100 pA in the entire range

Tip holder for STM

• compatible with the measuring head
• control by selecting the right software module

Software

• NanoDrive 8.05
• NanoPlot Nanolithography
• NanoScope Analysis Software Package