X-Ray Fluorescence Spectrometer is an instrument designed to determine the chemical composition of both solid and liquid samples and it is also possible to measure thin-film materials. The device is designed especially for survey input elemental analysis of samples supplied to the Center of Very Sensitive Analytical Instruments of the Research Center Řež. The device is primarily designed for the analysis of non-radioactive samples, but it can not be ruled out that some samples may contain a very small amount of plutonium-containing contemination.

• rapid elemental analysis form F to U
• sensitivity from <1 ppm up to 100%
• measuriement times 10-60 sec per element
• adjustable X-ray beam size form 1 to 15 mm
• sample imaging with CCD camera

Detector

• Si(Li)
• electrical cooling
• crystal area 15 mm2
• crystal depth 3,5 mm

X-ray Generator

• Rh standard, Ag optional
• maximum power 50 W
• voltage range 4-50 kV in 1 kV steps
• cuuurnt range 0,02-1,98 mA in 0,02 mA steps

Sample chamber

• maximum sample size 30 x 40 x 5 cm (possible expansion for higher samples)
• atmosphere: air, vacuum, optional He
• autosampler for 10 and 20 samples

Software

• WinTrace software
• collect and process up to eight filtered spectra per sample for any number of analytes
• advance deconvolution algorithms